Art
J-GLOBAL ID：200902102116782072   Reference number：00A0015722

An accurate measurement of magnetostriction of thin films by using nano-indentation system.

ナノ圧痕系を用いた薄膜の磁気ひずみの正確な測定
Author (2)：
SHIMA T

About SHIMA T

(Tohoku Univ., Sendai, JPN)

About Tohoku Univ., Sendai, JPN

, 
FUJIMORI H

About FUJIMORI H

(Tohoku Univ., Sendai, JPN)

About Tohoku Univ., Sendai, JPN


Material：
IEEE Transactions on Magnetics  (IEEE Trans Magn)

About IEEE Transactions on Magnetics


Volume： 35  Issue： 5,Pt.2  Page： 3832-3834  Publication year： Sep. 1999 
JST Material Number： A0339B  ISSN： 0018-9464  CODEN： IEMGAQ  Document type： Article
Article type： 原著論文  Country of issue： United States (USA)  Language： ENGLISH (EN)
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indentation (recess)

About indentation (recess)

,...
Semi thesaurus term：
Thesaurus term/Semi thesaurus term
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*magnetostriction

About magnetostriction


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JST classification (1)：
JST classification
Category name(code) classified by JST.
Measuring techniques and equipments of magnetic materials 
(BM06030I)

About Measuring techniques and equipments of magnetic materials

Terms in the title (3)：
Terms in the title
Keywords automatically extracted from the title.
ナノ圧痕

About ナノ圧痕

, 
薄膜

About 薄膜

, 
磁気ひずみ

About 磁気ひずみ


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