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J-GLOBAL ID:200902105249893852   Reference number:02A0278728

Acceptor Densities and Acceptor Levels in Undoped GaSb Determined by Free Carrier Concentration Spectroscopy.

自由キャリア濃度分光法により決定したアンドープGaSb中のアクセプタ密度とアクセプタ準位
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Volume: 41  Issue: 2A  Page: 496-500  Publication year: Feb. 15, 2002 
JST Material Number: G0520B  ISSN: 0021-4922  Document type: Article
Article type: 原著論文  Country of issue: Japan (JPN)  Language: ENGLISH (EN)
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Electronic structure of impurites and defects 
Reference (21):
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  • 2) R. D. Baxter, R. T. Bate and F. J. Reid: J. Phys. Chem. Solids 26 (1965) 41.
  • 3) R. D. Baxter, F. J. Reid and A. C. Beer: Phys. Rev. 162 (1967) 718.
  • 4) M. D. Campos, A. Gouskov, L. Gouskov and J. C.Pons: J. Appl. Phys. 44 (1973) 2642.
  • 5) R. A. Noack, W. Rühle and T. N. Morgan: Phys. Rev. B 18 (1978) 6944.
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