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J-GLOBAL ID:200902111452801718   Reference number:98A0660140

Comprehensive characterization of metal-semiconductor-metal ultraviolet photodetectors fabricated on single-crystal GaN.

単結晶GaN上に作製した金属-半導体-金属紫外光検出器の総合特性評価
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Material:
Volume: 83  Issue: 11, Pt.1  Page: 6148-6160  Publication year: Jun. 01, 1998 
JST Material Number: C0266A  ISSN: 0021-8979  CODEN: JAPIAU  Document type: Article
Article type: 原著論文  Country of issue: United States (USA)  Language: ENGLISH (EN)
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Photometry and photodetectors in general  ,  Semiconductor-metal contacts 

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