Art
J-GLOBAL ID：200902111479171732
Reference number：97A0013155
Dependence of effective carrier lifetime in iron-doped silicon crystals on the carrier injection level.
鉄をドープしたシリコン結晶における有効キャリア寿命のキャリア注入量依存性
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Author (1)：
Material：
Volume：
11
Issue：
11
Page：
1713-1717
Publication year：
Nov. 1996
JST Material Number：
E0503B
ISSN：
0268-1242
CODEN：
SSTEET
Document type：
Article
Article type：
原著論文
Country of issue：
United Kingdom (GBR)
Language：
ENGLISH (EN)
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JST classification (1)：
JST classification
Category name(code) classified by JST.
Electric conduction in crystalline semiconductors
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