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J-GLOBAL ID：200902120086880544
Reference number：96A0627790
Observation of Surface Defects using Photoacoustic Microscope and Quantitative Evaluation of the Defect Depth.
表面欠陥の光音響顕微鏡による観察と欠陥深さの定量評価
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Author (3)：
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Material：
Volume：
35
Issue：
5B
Page：
2916-2920
Publication year：
May. 1996
JST Material Number：
G0520B
ISSN：
0021-4922
Document type：
Article
Article type：
原著論文
Country of issue：
Japan (JPN)
Language：
ENGLISH (EN)
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Reference (7)：
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THOMAS, R. L. J.Appl.Phys. 1980, 51, 1152
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SAWADA, T. Jpn.J.Appl.Phys. 1981, 20, L25
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OGIWARA, M. Hihakai Kensa(NDT). 1987, 36, 730
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HOSHIMIYA, T. Photoacoustic and Photothermal Phenomena II. 1990, 533
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HOSHIMIYA, T. Jpn.J.Appl.Phys. 1992, 31, 3474
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