Effects of Annealing Conditions on Charge Loss Mechanisms in MOCVD Ba0.7Sr0.3TiO3 Thin Film Capacitors.

BANIECKI J D; LAIBOWITZ R B; SHAW T M; SAENGER K L; DUNCOMBE P R; CABRAL C; KOTECKI D E; SHEN H; MA Q Y

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J-GLOBAL ID：200902121586699508 Reference number：99A0653653

Effects of Annealing Conditions on Charge Loss Mechanisms in MOCVD Ba_0.7Sr_0.3TiO₃ Thin Film Capacitors.

MOCVDによるBa_0.7Sr_0.3TiO₃薄膜コンデンサにおける電荷損失へのアニール条件の影響

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Material：
Volume： 19 Issue： 6/7 Page： 1457-1461 Publication year： 1999
JST Material Number： E0801B ISSN： 0955-2219 Document type： Article
Article type：文献レビュー Country of issue： United Kingdom (GBR) Language： ENGLISH (EN)

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