Art
J-GLOBAL ID：200902125749110570   Reference number：02A0514757

Optical semiconductor device reliability.

光半導体デバイスの信頼性
Author (1)：
FUKUDA M

About FUKUDA M

(NTT Electronics Corp., Tokyo, JPN)

About NTT Electronics Corp., Tokyo, JPN


Material：
Microelectronics Reliability  (Microelectronics and Reliability)

About Microelectronics Reliability


Volume： 42  Issue： 4/5  Page： 679-683  Publication year： Apr. 2002 
JST Material Number： C0530A  ISSN： 0026-2714  Document type： Article
Article type： 原著論文  Country of issue： United Kingdom (GBR)  Language： ENGLISH (EN)
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*photodiode

About photodiode

,...
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JST classification (2)：
JST classification
Category name(code) classified by JST.
Photodetectors 
(NC03083X)

About Photodetectors

,  Semiconductor lasers 
(BD04070L)

About Semiconductor lasers

Terms in the title (1)：
Terms in the title
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光半導体デバイス

About 光半導体デバイス


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