Film thickness dependence of ferroelectric properties of c-axis-oriented epitaxial Bi4Ti3O12 thin films prepared by metalorganic chemical vapor deposition.

WATANABE T; SAIKI A; SAITO K; FUNAKUBO H

Art

J-GLOBAL ID：200902128874642779 Reference number：01A0542649

Film thickness dependence of ferroelectric properties of c-axis-oriented epitaxial Bi₄Ti₃O₁₂ thin films prepared by metalorganic chemical vapor deposition.

有機金属化学蒸着法で作製したc軸配向エピタキシャルBi₄Ti₃O₁₂薄膜の強誘電体特性の膜厚依存性

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Author (4)： , , ,
Material：
Volume： 89 Issue： 7 Page： 3934-3938 Publication year： Apr. 01, 2001
JST Material Number： C0266A ISSN： 0021-8979 CODEN： JAPIAU Document type： Article
Article type：原著論文 Country of issue： United States (USA) Language： ENGLISH (EN)

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Ferroelectrics,antiferroelectrics and ferroelasticity , Oxide thin films

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