In situ bulk lifetime measurement on silicon with a chemically passivated surface.

HORANYI T S; PAVELKA T; TUETTOE P

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J-GLOBAL ID：200902131666869990 Reference number：93A0238124

In situ bulk lifetime measurement on silicon with a chemically passivated surface.

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Author (3)： , ,
Material：
Volume： 63 Issue： 1/4 Page： 306-311 Publication year： Jan. 1993
JST Material Number： B0707B ISSN： 0169-4332 Document type： Article
Country of issue： Netherlands (NLD) Language： ENGLISH (EN)

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