Detailed analysis of scanning tunneling microscopy images of the Si(001) reconstructed surface with buckled dimers.

OKADA H; FUJIMOTO Y; ENDO K; HIROSE K; MORI Y

Art

J-GLOBAL ID：200902133825408209 Reference number：01A0679094

Detailed analysis of scanning tunneling microscopy images of the Si(001) reconstructed surface with buckled dimers.

バックルダイマがあるSi(001)再構成表面の走査型トンネル顕微鏡像の詳細な分析

Publisher site Copy service
Access JDreamⅢ for advanced search and analysis. {{ this.onShowJLink("http://jdream3.com/lp/jglobal/index.html?docNo=01A0679094&from=J-GLOBAL&jstjournalNo=D0746A") }}

Author (5)： , , , ,
Material：
Volume： 63 Issue： 19 Page： 195324.1-195324.7 Publication year： May. 15, 2001
JST Material Number： D0746A ISSN： 1098-0121 CODEN： PRBMDO Document type： Article
Article type：原著論文 Country of issue： United States (USA) Language： ENGLISH (EN)

,...

To see more with JDream III (charged). {{ this.onShowAbsJLink("http://jdream3.com/lp/jglobal/index.html?docNo=01A0679094&from=J-GLOBAL&jstjournalNo=D0746A") }}

Surface structure of semiconductors , Electronic structure of surfaces

, , , ,

Return to Previous Page