Art
J-GLOBAL ID:200902134432018367   Reference number:96A0798438

Very high breakdown voltage and large transconductance realized on GaN heterojunction field effect transistors.

GaNヘテロ接合電界効果トランジスタで実現した非常に高いブレークダウン電圧と大きい相互コンダクタンス
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Material:
Volume: 69  Issue: 10  Page: 1438-1440  Publication year: Sep. 02, 1996 
JST Material Number: H0613A  ISSN: 0003-6951  CODEN: APPLAB  Document type: Article
Article type: 短報  Country of issue: United States (USA)  Language: ENGLISH (EN)
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Semi thesaurus term:
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
On J-GLOBAL, this item will be available after more than half a year after the record posted. In addtion, medical articles require to login to MyJ-GLOBAL.

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JST classification
Category name(code) classified by JST.
Semiconductor-semiconductor contacts with Gr.13-15 element compounds  ,  Transistors 

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