Art
J-GLOBAL ID：200902137454093710   Reference number：98A0199652

Industrial Uses of STM and AFM.

STMとAFMの工業利用
Author (6)：
VORBURGER T V

About VORBURGER T V

(National Inst. Standards and Technol., MD, USA)

About National Inst. Standards and Technol., MD, USA

, 
DAGATA J A

About DAGATA J A

(National Inst. Standards and Technol., MD, USA)

About National Inst. Standards and Technol., MD, USA

, 
WILKENING G

About WILKENING G

(Physikalisch-Technische Bundesanstalt, Braunschweig, DEU)

About Physikalisch-Technische Bundesanstalt, Braunschweig, DEU

, 
LIZUKA K

About LIZUKA K

(Nikon Corp., Ibaraki, JPN)

About Nikon Corp., Ibaraki, JPN

, 
THWAITE E G

About THWAITE E G

, 
LONARDO P

About LONARDO P


Material：
CIRP Annals (International Inst. for Production Engineering Research)  (Manufacturing Technology)

About CIRP Annals (International Inst. for Production Engineering Research)


Volume： 46  Issue： 2  Page： 597-620  Publication year： 1997 
JST Material Number： E0026A  ISSN： 0007-8506  Document type： Article
Article type： 文献レビュー  Country of issue： United Kingdom (GBR)  Language： ENGLISH (EN)
Thesaurus term：
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
On J-GLOBAL, this item will be available after more than half a year after the record posted. In addtion, medical articles require to login to MyJ-GLOBAL.
atomic force microscope

About atomic force microscope

,...
   To see more with JDream III (charged).   {{ this.onShowAbsJLink("http://jdream3.com/lp/jglobal/index.html?docNo=98A0199652&from=J-GLOBAL&jstjournalNo=E0026A") }}
JST classification (1)：
JST classification
Category name(code) classified by JST.
Electron and ion microscopes 
(BD02050B)

About Electron and ion microscopes

Terms in the title (3)：
Terms in the title
Keywords automatically extracted from the title.
STM

About STM

, 
AFM

About AFM

, 
工業

About 工業


Return to Previous Page

TOP

BOTTOM