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J-GLOBAL ID:200902138178551012   Reference number:00A0544447

Charging States of Si Quantum Dots as Detected by AFM/Kelvin Probe Technique.

AFM/Kelvinプローブ法によって検出したSi量子ドットの荷電状態
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Volume: 39  Issue: 4B  Page: 2318-2320  Publication year: Apr. 30, 2000 
JST Material Number: G0520B  ISSN: 0021-4922  Document type: Article
Article type: 原著論文  Country of issue: Japan (JPN)  Language: ENGLISH (EN)
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Metal-insulator-semiconductor structures 
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