Art
J-GLOBAL ID:200902141643642632   Reference number:02A0935254

Quantitative measurement of surface potential and amount of charging on insulator surface under electron beam irradiation.

電子ビーム照射下の絶縁体表面における表面ポテンシャルと帯電量の定量測定
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Material:
Volume: 92  Issue: 10  Page: 6128-6133  Publication year: Nov. 15, 2002 
JST Material Number: C0266A  ISSN: 0021-8979  CODEN: JAPIAU  Document type: Article
Article type: 原著論文  Country of issue: United States (USA)  Language: ENGLISH (EN)
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Semi thesaurus term:
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
On J-GLOBAL, this item will be available after more than half a year after the record posted. In addtion, medical articles require to login to MyJ-GLOBAL.

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JST classification
Category name(code) classified by JST.
Measuring techniques and equipments of dielectric properties  ,  Interactions with electrons and positrons in general 

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