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J-GLOBAL ID:200902143599308145   Reference number:02A0698103

Grazing Incidence In-Plane X-Ray Diffraction Study on Oriented Copper Phthalocyanine Thin Films.

配向した銅フタロシアニン薄膜に関するすれすれ入射面内X線回折研究
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Material:
Volume: 41  Issue:Page: 5467-5471  Publication year: Aug. 15, 2002 
JST Material Number: G0520B  ISSN: 0021-4922  Document type: Article
Article type: 原著論文  Country of issue: Japan (JPN)  Language: ENGLISH (EN)
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Thin films of organic compounds  ,  X-ray diffraction methods 
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