Art
J-GLOBAL ID：200902147141734043   Reference number：01A1035747

Novel Monitoring Method and Long-term Reliability Evaluation of Power Semiconductor Devices in Power Utilities.

電力施設におけるパワー半導体デバイスの新しいモニタ法と長期信頼性評価
Author (2)：
HORIUCHI T

About HORIUCHI T

(Kansai Electric Power Co., Inc., Hyogo Prefecture, JPN)

About Kansai Electric Power Co., Inc., Hyogo Prefecture, JPN

, 
SUGAWARA Y

About SUGAWARA Y

(Kansai Electric Power Co., Inc., Hyogo Prefecture, JPN)

About Kansai Electric Power Co., Inc., Hyogo Prefecture, JPN


Material：
Proceedings. International Symposium on Power Semiconductor Devices and ICs  (IEEE International Symposium on Power Semiconductor Devices & IC's)

About Proceedings. International Symposium on Power Semiconductor Devices and ICs


Volume： 13th  Page： 75-78  Publication year： 2001 
JST Material Number： W1300A  ISSN： 1943-653X  Document type： Proceedings
Article type： 原著論文  Country of issue： United States (USA)  Language： ENGLISH (EN)
Thesaurus term：
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
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*power electronics

About power electronics

,...
Semi thesaurus term：
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
On J-GLOBAL, this item will be available after more than half a year after the record posted. In addtion, medical articles require to login to MyJ-GLOBAL.
monitoring

About monitoring

,...
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JST classification (3)：
JST classification
Category name(code) classified by JST.
Measurement,testing and reliability of solid-state devices 
(NC03040G)

About Measurement,testing and reliability of solid-state devices

,  Thyristors 
(NC03060C)

About Thyristors

,  Electric power equipment in general 
(NB06000G)

About Electric power equipment in general

Terms in the title (6)：
Terms in the title
Keywords automatically extracted from the title.
電力施設

About 電力施設

, 
パワー

About パワー

, 
半導体デバイス

About 半導体デバイス

, 
モニタ

About モニタ

, 
長期

About 長期

, 
信頼性評価

About 信頼性評価


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