Characterization of Pure Water-Treated GaAs Surfaces by Measuring Contact Angles of Water Droplets.

MATSUSHITA K; FUJISAWA A; ANDO N; KOBAYASHI H; NAGANUMA H; OKUYAMA S; OKUYAMA K

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J-GLOBAL ID：200902152503149679 Reference number：01A0773788

Characterization of Pure Water-Treated GaAs Surfaces by Measuring Contact Angles of Water Droplets.

水滴接触角の測定による純水処理GaAs表面の特性解析

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Author (7)： , , , , , ,
Material：
Volume： 148 Issue： 8 Page： F170-F174 Publication year： Aug. 2001
JST Material Number： C0285A ISSN： 1945-7111 CODEN： JESOAN Document type： Article
Article type：原著論文 Country of issue： United States (USA) Language： ENGLISH (EN)

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Surface structure of semiconductors

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