Bismuth-induced surface structure of Si(100) studied by scanning tunneling microscopy.

NAITOH M; SHIMAYA H; NISHIGAKI S; OISHI N; SHOJI F

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J-GLOBAL ID：200902153328538914 Reference number：99A0535040

Bismuth-induced surface structure of Si(100) studied by scanning tunneling microscopy.

走査型トンネル顕微鏡で調べたSi(100)のビスマス誘起表面構造

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Material：
Volume： 142 Issue： 1/4 Page： 38-42 Publication year： Apr. 1999
JST Material Number： B0707B ISSN： 0169-4332 Document type： Article
Article type：原著論文 Country of issue： Netherlands (NLD) Language： ENGLISH (EN)

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Study of adsorption by physical means , Surface structure of semiconductors

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