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J-GLOBAL ID:200902154967092214   Reference number:98A0095720

Temperature dependence measurements of complex permittivity of dielectric plates at 50GHz by the cavity resonance method.

50GHz帯における空洞共振器法による誘電体平板の複素誘電率の温度依存性の測定
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Volume: 97  Issue: 374(MW97 114-126)  Page: 27-30  Publication year: Nov. 14, 1997 
JST Material Number: S0532B  ISSN: 0913-5685  Document type: Proceedings
Article type: 原著論文  Country of issue: Japan (JPN)  Language: JAPANESE (JA)
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Measuring techniques and equipments of dielectric properties  ,  Resonator 
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