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J-GLOBAL ID:200902154967092214
Reference number:98A0095720
Temperature dependence measurements of complex permittivity of dielectric plates at 50GHz by the cavity resonance method.
50GHz帯における空洞共振器法による誘電体平板の複素誘電率の温度依存性の測定
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Author (3):
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Material:
Volume:
97
Issue:
374(MW97 114-126)
Page:
27-30
Publication year:
Nov. 14, 1997
JST Material Number:
S0532B
ISSN:
0913-5685
Document type:
Proceedings
Article type:
原著論文
Country of issue:
Japan (JPN)
Language:
JAPANESE (JA)
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JST classification (2):
JST classification
Category name(code) classified by JST.
Measuring techniques and equipments of dielectric properties
, Resonator
Reference (6):
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KOBAYASHI, Y. Microwave measurement of complex permittivity of dielectric plate materials. Papers of Technical Group on Microwaves, Inst. Elect. Inf. Commun. Engns. Jap. 1987, MW87-7
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KOBAYASHI, Y. Nondestructive measurement of complex permittivity of dielectric plate materials by a cavity resonance method. Papers of Technical Group on Microwaves, Inst. Elect. Inf. Commun. Engns. Jap. 1987, MW87-53
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KOBAYASHI, Y. Complex Permittivity Measurement of Dielectric Plates by a Cavity Resonance Method. Papers of Technical Group on Microwaves, Inst. Elect. Inf. Commun. Engns. Jap. 1988, MW88-40
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KOBAYASHI, Y. Millimeter wave measurement of complex permittivity by improved dielectric disk resonator method. The 13th International Conference on Infrared and Millimeter Waves, Dec. 5-9. 302-303
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金川. 導波管励振誘電体平板共振器を用いたミリ波複素誘電率の非破壊測定. 信学技報. 1994, MW94-40
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