Art
J-GLOBAL ID:200902155297480010   Reference number:96A0948016

Energy Analyses of Substrate-incident Ion on TiO2 Deposition by RF Magnetron Sputtering.

RFマグネトロンスパッタによるTiO2薄膜作成における基板入射イオンのエネルギー分析
Author (3):
Material:
Volume: 57th  Issue:Page: 21  Publication year: Sep. 1996 
JST Material Number: Y0055A  Document type: Proceedings
Country of issue: Japan (JPN)  Language: JAPANESE (JA)

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