Art
J-GLOBAL ID:200902157312407343   Reference number:97A0748380

Charge fractions and energy width of heavy ion beam probe for large helical device.

大型ヘリカル装置用重イオンビームプローブの電荷フラクション及びエネルギー幅
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Material:
Volume: 34/35  Page: 675-678  Publication year: Mar. 1997 
JST Material Number: T0497A  ISSN: 0920-3796  CODEN: FEDEEE  Document type: Article
Article type: 原著論文  Country of issue: Netherlands (NLD)  Language: ENGLISH (EN)
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Semi thesaurus term:
Thesaurus term/Semi thesaurus term
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All keywords is available on JDreamIII(charged).
On J-GLOBAL, this item will be available after more than half a year after the record posted. In addtion, medical articles require to login to MyJ-GLOBAL.

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Category name(code) classified by JST.
Plasma diagnostics 

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