Formation and observation of 50 nm polarized domains in PbZr1-xTixO3 thin film using scanning probe microscope.

HIDAKA T; MARUYAMA T; SAITOH M; MIKOSHIBA N; SHIMIZU M; SHIOSAKI T; WILLS L A; HISKES R; AMANO J

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J-GLOBAL ID：200902157470884825 Reference number：96A0448663

Formation and observation of 50 nm polarized domains in PbZr_1-xTi_xO₃ thin film using scanning probe microscope.

走査型プローブ顕微鏡を用いたPbZr_1-xTi_xO₃薄膜における50nmの分極した分域の形成と観察

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Material：
Volume： 68 Issue： 17 Page： 2358-2359 Publication year： Apr. 22, 1996
JST Material Number： H0613A ISSN： 0003-6951 CODEN： APPLAB Document type： Article
Article type：短報 Country of issue： United States (USA) Language： ENGLISH (EN)

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Ferroelectrics,antiferroelectrics and ferroelasticity , Electronic recording,magnetic recording,optical recording

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