Art
J-GLOBAL ID：200902159228160181   Reference number：02A0479480

Survey of Low-Power Testing of VLSI Circuits.

VLSI回路の低電力試験の調査
Author (1)：
GIRARD P

About GIRARD P

(Lab. Informatics, Robotics and Microelectronics of Montpellier)

About Lab. Informatics, Robotics and Microelectronics of Montpellier


Material：
IEEE Design & Test of Computers  (IEEE Des Test Comput)

About IEEE Design & Test of Computers


Volume： 19  Issue： 3  Page： 82-92  Publication year： May. 2002 
JST Material Number： B0007C  ISSN： 0740-7475  Document type： Article
Article type： 解説  Country of issue： United States (USA)  Language： ENGLISH (EN)
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VLSI

About VLSI

,...
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JST classification (1)：
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Measurement,testing and reliability of solid-state devices 
(NC03040G)

About Measurement,testing and reliability of solid-state devices

Terms in the title (3)：
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Keywords automatically extracted from the title.
VLSI回路

About VLSI回路

, 
電力試験

About 電力試験

, 
調査

About 調査


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