Art
J-GLOBAL ID：200902162571173818
Reference number：00A0826009
Development of a Remotely Accessible Integrated Circuit Test Facility Based on Telepresence.
テレプレゼンスを基にした遠隔アクセス可能な集積回路試験設備の開発
-
Publisher site
Copy service
{{ this.onShowCLink("http://jdream3.com/copy/?sid=JGLOBAL&noSystem=1&documentNoArray=00A0826009©=1") }}
-
Access JDreamⅢ for advanced search and analysis.
{{ this.onShowJLink("http://jdream3.com/lp/jglobal/index.html?docNo=00A0826009&from=J-GLOBAL&jstjournalNo=B0689B") }}
Author (2)：
,
Material：
Volume：
17th
Issue：
Vol.3
Page：
1591-1595
Publication year：
2000
JST Material Number：
B0689B
ISSN：
1091-5281
Document type：
Proceedings
Article type：
原著論文
Country of issue：
United States (USA)
Language：
ENGLISH (EN)
Thesaurus term：
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
On J-GLOBAL, this item will be available after more than half a year after the record posted. In addtion, medical articles require to login to MyJ-GLOBAL.
,...
JST classification (2)：
JST classification
Category name(code) classified by JST.
Measurement,testing and reliability of solid-state devices
, Computer networks
Terms in the title (5)：
Terms in the title
Keywords automatically extracted from the title.
,
,
,
,
Return to Previous Page
