Art
J-GLOBAL ID：200902162755788769   Reference number：96A0635554

Scanning nonlinear dielectric microscope.

走査型非線形誘電顕微鏡
Author (3)：
CHO Y

About CHO Y

(Yamaguchi Univ., Ube, JPN)

About Yamaguchi Univ., Ube, JPN

, 
KIRIHARA A

About KIRIHARA A

(Yamaguchi Univ., Ube, JPN)

About Yamaguchi Univ., Ube, JPN

, 
SAEKI T

About SAEKI T

(Yamaguchi Univ., Ube, JPN)

About Yamaguchi Univ., Ube, JPN


Material：
Review of Scientific Instruments  (Rev Sci Instrum)

About Review of Scientific Instruments


Volume： 67  Issue： 6  Page： 2297-2303  Publication year： Jun. 1996 
JST Material Number： D0517A  ISSN： 0034-6748  CODEN： RSINAK  Document type： Article
Article type： 原著論文  Country of issue： United States (USA)  Language： ENGLISH (EN)
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All keywords is available on JDreamIII(charged).
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scanning probe microscope

About scanning probe microscope

,...
Semi thesaurus term：
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
On J-GLOBAL, this item will be available after more than half a year after the record posted. In addtion, medical articles require to login to MyJ-GLOBAL.
PZT

About PZT


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JST classification (2)：
JST classification
Category name(code) classified by JST.
Measuring techniques and equipments of dielectric properties 
(BM05020Q)

About Measuring techniques and equipments of dielectric properties

,  Microscopy determination of structures 
(BK01040E)

About Microscopy determination of structures

Terms in the title (3)：
Terms in the title
Keywords automatically extracted from the title.
走査型

About 走査型

, 
非線形

About 非線形

, 
顕微鏡

About 顕微鏡


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