J-GLOBAL ID:200901003907438870   Update date: Jul. 29, 2020

Cho Yasuo

チョウ ヤスオ | Cho Yasuo
Homepage URL  (2): http://db.tohoku.ac.jp/whois/detail/9b9e2d9e3ba073cf13b65ff28b7a55b9.htmlhttp://db.tohoku.ac.jp/whois/e_detail/9b9e2d9e3ba073cf13b65ff28b7a55b9.html
Research field  (1): Electronic devices and equipment
Research keywords  (6): 半導体計測 ,  強誘電体記録 ,  走査型非線形誘電率顕微鏡 ,  薄膜表面界面物性 ,  電子デバイス ,  応用物理学
Research theme for competitive and other funds  (16):
  • 2003 - 2003 非線形誘電率顕微鏡法を用いた超高密度強誘電体記録用材料の研究
  • 2000 - 2000 非線形誘電率顕微鏡法を用いた単一永久双極子モーメントの可視化
  • 2000 - 強誘電体超高密度記録
  • 1999 - 1999 強誘電体中の単一双極子モーメントの可視化と単一双極子メモリーに関する研究
  • 1999 - 1999 サブナノメータ分解能を持つ走査型非線形誘電率顕微鏡の開発と単一双極子の可視化
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Papers (375):
  • Yasuo Cho, Sachiko Jonai, Atsushi Masuda. A scanning nonlinear dielectric microscopic investigation of potential-induced degradation in monocrystalline silicon solar cells. Appl. Phys. Lett.,. 2020. 116. 182107-1-182107-4
  • Kohei Yamasue, Yuji Yamagishi, Yasuo Cho. Influence of non-uniform interface defect clustering on field-effect mobility in SiC MOSFETs investigated by local deep level transient spectroscopy and device simulation. Mater. Sci. Forum. 2020. 1004. 627-634
  • Anna Hosaka, Kohei Yamasue, Judith Woerle, Corrado Bongiorno, Gabriel Ferro, Ulrike Grossner, Massimo Camarda, Yasuo Cho. Evaluation of interface defect density distribution on macrostepped SiO2/SiC by time-resolved local deep level transient spectroscopy. The 38th Annual NANO Testing Symposium (NANOTS2019). 2019. 75-79
  • Kohei Yamasue, Yasuo Cho. Improvement of signal-to-noise ratio in semiconductor carrier distribution imaging by intermittent scanning nonlinear dielectric microscopy. The 38th Annual NANO Testing Symposium (NANOTS2019). 2019. 130-134
  • Koki Takano, Kohei Yamasue, Yasuo Cho. Development of cantilevers with insulating coating for semiconductor carrier distribution imaging using scanning nonlinear dielectric microscopy and its application to layered semiconductors. The 38th Annual NANO Testing Symposium (NANOTS2019). 2019. 135-140
MISC (17):
Patents (60):
  • 透磁率測定装置
  • 記録再生ヘッド及び記録再生装置
  • 誘電体情報装置,テープ状媒体記録再生装置及びディスク状媒体記録再生装置
  • 走査型非線形誘電率顕微鏡を応用した超高感度変位計測方式
Books (19):
  • Scanning Nonlinear Dielectric Microscopy 1st Edition - Investigation of Ferroelectric, Dielectric, and Semiconductor Materials and Devices -
    ELSEVIER 2020 ISBN:9780128172469
  • マイクロビームアナリシス・ハンドブック
    オーム社 2014 ISBN:9784274504969
  • Innovative Graphene Technologies: Evaluation and Applications Volume 2
    SMITHERS RAPRA TECHNOLOGY LTD, 2013 2013 ISBN:9781909030213
  • Applied Scanning Probe Methods X-Biomimetics and Industrial Applications-
    Springer 2008 ISBN:9783540740841
  • Roadmap of Scanning Probe Microscopy
    Springer (Germany) 2006
Lectures and oral presentations  (821):
  • Temperature Dependence of Intrinsic Nonlinear Permittivity and Material Design of Recording Media for Ferroelectric Probe Data Storage
  • Scanning nonlinear dielectric microscopy nano science and technology for next generation ultra-high density ferroelectric data storage beyond hard disk drive and flash memory
    (ISyDMA’5 Virtual Edition 2020)
  • Observation of interface state density distribution in macrostepped SiO2/SiC using local-DLTS(2)
  • 2D Interface Defect Density Evaluation on Macrostepped SiO2/SiC Using Local Deep Level Transient Spectroscopy Based on Scanning Nonlinear Dielectric Microscopy
    (50th IEEE Semiconductor Interface Specialists Conference 2019)
  • A New Evaluation Technique for Interface Defect Density on High-κ/SiO2/Si and SiO2/Si Gate Stacks using Scanning Nonlinear Dielectric Microscopy
    (50th IEEE Semiconductor Interface Specialists Conference 2019)
Professional career (1):
  • 工学博士 (Tohoku University)
Committee career (20):
  • 2019/12 - 現在 The Dielectric Society of Japan Director and Vice Chair
  • 2012/04 - 現在 Japan-Korea Conference on Ferroelectricity Organizing Committee委員
  • 2006/04 - 現在 強誘電体応用会議 論文委員,運営委員
  • 2012/04 - 2013/03 International Conference on Non-contact Atomic Force Microscopy Program Committee 委員
  • 2006/04 - 強誘電体応用会議 運営委員
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Awards (14):
  • 2018/09 - The Japan Society of Applied Physics 40th JSAP Outstanding Paper Award Recipients 2018(Award for Best Review Paper) High resolution characterizations of fine structure of semiconductor device and material using scanning nonlinear dielectric microscopy
  • 2015/04/15 - 文部科学省 文部科学大臣 平成27年度 科学技術分野の文部科学大臣表彰 科学技術賞 開発部門 走査型非線形誘電率顕微鏡法の開発
  • 2014/10/09 - 公益財団法人 服部報公会 2014年服部報公会「報公賞」 非線形誘電率顕微鏡の発明・実用化と電子デバイス開発への応用
  • 2009/09/29 - ISIF<SUP>2</SUP>(Inrernational Symposium on Integrated Ferroelectrics and Functionalities) ISIF<SUP>2</SUP> OUTSTANDING ACHIEVEMENT AWARD For work in scanning nonlinear dielectric microscopy in the field of Ferroelectric Materials
  • 2008/04/08 - The Japan Society of Applied Physics JJAP Editorial Contribution Award
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Association Membership(s) (5):
The Dielectric Society of Japan ,  日本音響学会 ,  応用物理学会 ,  電子情報通信学会 ,  米国電気電子学会(The Institute of Electrical and Electronics Engineers,Inc.)
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