Rchr
J-GLOBAL ID:200901003907438870   Update date: Sep. 27, 2024

Cho Yasuo

チョウ ヤスオ | Cho Yasuo
Affiliation and department:
Homepage URL  (1): http://d-nanodev.niche.tohoku.ac.jp/
Research field  (1): Electronic devices and equipment
Research keywords  (6): 半導体計測 ,  強誘電体記録 ,  走査型非線形誘電率顕微鏡 ,  薄膜表面界面物性 ,  電子デバイス ,  応用物理学
Research theme for competitive and other funds  (53):
  • 2021 - 2023 走査型非線形誘電率顕微鏡を用いたGaN-MOSの高性能化に資する計測評価
  • 2021 - 2023 Elucidation of atomic structure and dynamics of carrier trap sites
  • 2016 - 2022 Origin elucidation of the problems in the interface electric charge transportation phenomenon using scanning nonlinear dielectric microscopy
  • 2014 - 2019 超高次非線形誘電率顕微鏡法を用いたSiC基板材料及びパワーエレクトロニクス素子の高性能化に資する評価技術の開発
  • 2015 - 2018 Measurement method for polarity-inverted layered piezoelectric thin films using scanning nonlinear dielectric microscopy
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Papers (412):
  • Yasuo Cho, Ryo Nakagawa, Toshimaro Yoneda, Takeshi Nakao, Mamoru Ikeura. Nonlinear, elastic, piezoelectric, electrostrictive, and dielectric constants of lithium tantalate. Journal of Applied Physics. 2024. 136. 12
  • Takashi Sakamoto, Tadayuki Imai, Masahiro Sasaura, Shogo Yagi, Kazuo Fujiura, Yasuo Cho. In-plane distribution of huge local permittivity of KTa1-xNbxO3 estimated from local phase transition temperatures and spatially averaged permittivity. Review of Scientific Instruments. 2024. 95. 7
  • Yoshiomi Hiranaga, Yuki Noguchi, Takanori Mimura, Takao Shimizu, Hiroshi Funakubo, Yasuo Cho. Data-Driven Analysis of High-Resolution Hyperspectral Image Data Sets through Nanoscale Capacitance-Voltage Measurements to Visualize Ferroelectric Domain Dynamics. ACS Applied Nano Materials. 2024. 7. 8. 8525-8536
  • Kohei Yamasue, Yasuo Cho. Correlation analysis on local capacitance-voltage profiles of a SiO<sub>2</sub>/SiC interface observed by time-resolved scanning nonlinear dielectric microscopy. 2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM). 2023
  • Kohei Yamasue, Yasuo Cho. Local capacitance-voltage profiling and deep level transient spectroscopy of SiO2/SiC interfaces by scanning nonlinear dielectric microscopy. Microelectronics Reliability. 2022. 135. 114588-114588
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MISC (128):
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Patents (60):
  • 透磁率測定装置
  • 記録再生ヘッド及び記録再生装置
  • DATA RECORDING/REPRODUCING APPARATUS AND METHOD USING NEEDLE-SHAPED MEMBER
  • 誘電体情報装置,テープ状媒体記録再生装置及びディスク状媒体記録再生装置
  • 走査型非線形誘電率顕微鏡を応用した超高感度変位計測方式
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Books (19):
  • Scanning Nonlinear Dielectric Microscopy - Investigation of Ferroelectric, Dielectric, and Semiconductor Materials and Devices -
    ELSEVIER 2020 ISBN:9780128172469
  • マイクロビームアナリシス・ハンドブック
    オーム社 2014 ISBN:9784274504969
  • Innovative Graphene Technologies: Evaluation and Applications Volume 2
    SMITHERS RAPRA TECHNOLOGY LTD, 2013 2013 ISBN:9781909030213
  • Applied Scanning Probe Methods X-Biomimetics and Industrial Applications-
    Springer 2008 ISBN:9783540740841
  • Roadmap of Scanning Probe Microscopy
    Springer (Germany) 2006
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Lectures and oral presentations  (944):
  • Determination of Nonlinear Elastic Constants of Polycrystalline Metallic Materials Used in Surface Acoustic Wave Devices
    (UFFC-JS 2024 (Ultrasonics, Ferroelectrics, and Frequency Control Joint Symposium) 2024)
  • Measurement of Stress Free Electrostrictive Constants and Nonlinear Dielectric Constants of LiNbO3 Single Crystal
    (UFFC-JS 2024 (Ultrasonics, Ferroelectrics, and Frequency Control Joint Symposium) 2024)
  • 走査型非線形誘電率顕微鏡によるAl2O3/OHダイヤモンド(111)の局所DLTS/CV特性同時測定
    (第85回応用物理学会秋季学術講演会 2024)
  • 第一原理計算を用いた Si(111)-(7x7)表面における表面双極子の可視化
    (第85回応用物理学会秋季学術講演会 2024)
  • 実用的強誘電体記録を目指したPZT大面積記録媒体の開発
    (第85回応用物理学会秋季学術講演会 2024)
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Professional career (1):
  • 工学博士 (Tohoku University)
Committee career (38):
  • 2018/11 - 現在 ナノテスティング学会企画運営委員会 企画運営委員
  • 2012/04 - 現在 Japan-Korea Conference on Ferroelectricity Organizing Committee委員
  • 2019/12 - 2022/03 The Dielectric Society of Japan Director and Vice Chair
  • 2006/04 - 2022/03 強誘電体応用会議 論文委員,運営委員
  • 2012/04 - 2013/03 International Conference on Non-contact Atomic Force Microscopy Program Committee 委員
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Awards (14):
  • 2018/09 - The Japan Society of Applied Physics 40th JSAP Outstanding Paper Award Recipients 2018(Award for Best Review Paper) High resolution characterizations of fine structure of semiconductor device and material using scanning nonlinear dielectric microscopy
  • 2015/04/15 - 文部科学省 文部科学大臣 平成27年度 科学技術分野の文部科学大臣表彰 科学技術賞 開発部門 走査型非線形誘電率顕微鏡法の開発
  • 2014/10/09 - 公益財団法人 服部報公会 2014年服部報公会「報公賞」 非線形誘電率顕微鏡の発明・実用化と電子デバイス開発への応用
  • 2009/09/29 - ISIF<SUP>2</SUP>(Inrernational Symposium on Integrated Ferroelectrics and Functionalities) ISIF<SUP>2</SUP> OUTSTANDING ACHIEVEMENT AWARD For work in scanning nonlinear dielectric microscopy in the field of Ferroelectric Materials
  • 2008/04/08 - The Japan Society of Applied Physics JJAP Editorial Contribution Award
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Association Membership(s) (6):
IDEMA JAPAN ,  The Dielectric Society of Japan ,  日本音響学会 ,  応用物理学会 ,  電子情報通信学会 ,  米国電気電子学会(The Institute of Electrical and Electronics Engineers,Inc.)
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