Art
J-GLOBAL ID:200902175019565030
Reference number:02A0186778
Mechanisms of capture- and recombination-enhanced defect reactions in semiconductors.
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Author (1):
Material:
Volume:
308/310
Page:
506-509
Publication year:
Dec. 2001
JST Material Number:
H0676B
ISSN:
0921-4526
Document type:
Article
Country of issue:
Netherlands (NLD)
Language:
ENGLISH (EN)
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