Characterization of CuInS<sub>2</sub> thin films prepared by sputtering from binary compounds.

YAMAMOTO Y; YAMAGUCHI T; TANAKA T; TANAHASHI N; YOSHIDA A

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J-GLOBAL ID：200902175826169318 Reference number：98A0041511

Characterization of CuInS₂ thin films prepared by sputtering from binary compounds.

2元化合物からのスパッタリングにより作製したCuInS₂薄膜の特性化

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Author (5)： , , , ,
Material：
Volume： 49 Issue： 1/4 Page： 399-405 Publication year： Dec. 1997
JST Material Number： D0513C ISSN： 0927-0248 Document type： Article
Article type：原著論文 Country of issue： Netherlands (NLD) Language： ENGLISH (EN)

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Semiconductor thin films , Materials of solid-state devices

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Characterization of CuInS2 thin films prepared by sputtering from binary compounds.

Characterization of CuInS₂ thin films prepared by sputtering from binary compounds.