Art

J-GLOBAL ID：200902177507146073   Reference number：98A0672168

Analysis of Stress Gradient in Ceramic Film by X-ray Method.

X線によるセラミック膜の応力こう配の解析

Author (3)： SUZUKI K (Niigata Univ., Niigata, JPN) ,  TANAKA K (Nagoya Univ., Nagoya, JPN) ,  SAKAIDA Y (Nagoya Univ., Nagoya, JPN)
Material： JSME International Journal. Series A. Solid Mechanics and Material Engineering (Japan Society of Mechanical Engineers)  (JSME International Journal. Series A. Mechanics and Material Engineering)
Volume： 41  Issue： 3  Page： 416-421  Publication year： Jul. 1998 
JST Material Number： G0026B  ISSN： 1344-7912  Document type： Article
Article type： 原著論文  Country of issue： Japan (JPN)  Language： ENGLISH (EN)

Thesaurus term： *ceramic coating ,...

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JST classification (1)： Ceramic materials  (HC02040T)

Reference (15)：

• CHEN, P. C. Residual Stress Analysis of a Muti-Layer Thin Film Structure by Destructive(Curvature) and Non-Destructive (X-ray) Method. Mat. Res. Soc. Symp. Proc. 1989, 153, 363
• OSHIDA, Y. Nondestructive Low-Cycle Fatigue Characterization of Multi-Layer Thin Film Structure. J. Nondestr. Eval. 1989, 8, 4, 235
• EIGENMANN, B. X-ray Residual Stress Determination in Thin Chromium Coatings on Steel. Surface Eng. 1991, 7, 3, 221
• IDEMITSU, K. X-ray Measurement of Residual Stress Distribution in Later Heat Treated TiN Coated Caron Steels. Nondestr. Test Eval. 1992, 8, 9, 919
• DURAND, N. Origin of Residual Stress in a Textured Au Thin Film on a LiF Substrate. Appl. Surface Sci. 1994, 81, 191

Terms in the title (4)： X線 ,  セラミック膜 ,  応力こう配 ,  解析