Art
J-GLOBAL ID：200902186977983825
Reference number：02A0109016
Partial Disorder of the Si(111)6 × 6-Au Surface Studied by Scanning Tunneling Microscopy.
走査型トンネル顕微鏡観察によって研究したSi(111)6×6-Au表面の部分的不規則性
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Author (4)：
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Material：
Volume：
40
Issue：
12
Page：
6985-6992
Publication year：
Dec. 15, 2001
JST Material Number：
G0520B
ISSN：
0021-4922
Document type：
Article
Article type：
原著論文
Country of issue：
Japan (JPN)
Language：
ENGLISH (EN)
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JST classification (2)：
JST classification
Category name(code) classified by JST.
Surface structure of semiconductors
, Metallic thin films
Terms in the title (5)：
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