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J-GLOBAL ID:200902193332594812   Reference number:99A0518448

Tensile Strain Introduced in AlN Layer Grown by Metal-Organic Vapor-Phase Epitaxy on (0001) 6H-SiC with (GaN/AlN) Buffer.

有機金属気相エピタクシーで(GaN/AlN)バッファを持つ(0001)6H-SiC上に成長させたAlN層中の引っ張り歪
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Volume: 38  Issue: 5B  Page: L551-L553  Publication year: May. 15, 1999 
JST Material Number: F0599B  ISSN: 0021-4922  Document type: Article
Article type: 短報  Country of issue: Japan (JPN)  Language: ENGLISH (EN)
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Semiconductor thin films 
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