Art
J-GLOBAL ID：200902194321947264   Reference number：94A0148696

A Metric for Line Segments.

直線成分のための距離
Author (1)：
NACKEN P F M

About NACKEN P F M

(Center for Mathematics and Computer Science, Amsterdam, NLD)

About Center for Mathematics and Computer Science, Amsterdam, NLD


Material：
IEEE Transactions on Pattern Analysis and Machine Intelligence  (IEEE Transactions on Pattern Analysis & Machine Intelligence)

About IEEE Transactions on Pattern Analysis and Machine Intelligence


Volume： 15  Issue： 12  Page： 1312-1318  Publication year： Dec. 1993 
JST Material Number： B0519B  ISSN： 0162-8828  CODEN： ITPIDJ  Document type： Article
Article type： 原著論文  Country of issue： United States (USA)  Language： ENGLISH (EN)
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image analysis

About image analysis

,...
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JST classification (1)：
JST classification
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Pattern recognition 
(JE07000S)

About Pattern recognition

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直線

About 直線


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