Art
J-GLOBAL ID：200902200090882830
Reference number：05A0298351
Refinement of Crystal Structural Parameters and Charge Density Distribution Using Convergent-beam Electron Diffraction
電子線で今何ができるか1.電子線結晶構造解析の最先端 収束電子回折法による結晶構造・電子密度分布の精密化
Author (1)：
Material：
Volume：
47
Issue：
1
Page：
50-54
Publication year：
Feb. 28, 2005
JST Material Number：
G0232A
ISSN：
0369-4585
CODEN：
NKEGAF
Document type：
Article
Article type：
原著論文
Country of issue：
Japan (JPN)
Language：
JAPANESE (JA)
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JST classification (1)：
JST classification
Category name(code) classified by JST.
Electron diffraction methods
Reference (22)：
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1) M. Tanaka et al.: J. Microscopy 194, 219 (1999) .
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2) Y. Ogata, K. Tsuda, Y. Akishige and M. Tanaka: Acta Crvst. A60, 525 (2004) .
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3) J. C. H. Spence and J. M. Zuo: Electron Microdiffraction, Plenum Press. New York and London, (1992) .
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4) J. M. Zuo et al.: Nature 401, 49 (1999) .
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5) M. Saunders et al.: Acta Cryst. A55, 471 (1999) .
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