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J-GLOBAL ID：200902207061953936   Reference number：04A0592868

The Measurement of the Transmission Spectrum of an Amorphous Semiconductor Thin Film

非晶質半導体薄膜の透過スペクトルの測定
Author (1)：
HAYASHI K

About HAYASHI K

(Gifu Univ., Gifu, JPN)

About Gifu Univ., Gifu, JPN


Material：
UVSOR Activity Report  (UVSOR Act Rep)

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Volume： 2003  Page： 58  Publication year： Jul. 2004 
JST Material Number： L2127A  ISSN： 0911-5730  Document type： Article
Article type： 短報  Country of issue： Japan (JPN)  Language： ENGLISH (EN)
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All keywords is available on JDreamIII(charged).
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amorphous semiconductor

About amorphous semiconductor

,...
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JST classification (3)：
JST classification
Category name(code) classified by JST.
Other physical chemistry in general 
(CB01030T)

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,  Optical properties of condensed matter in general 
(BM08010A)

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,  Semiconductor thin films 
(BK14040E)

About Semiconductor thin films

Terms in the title (3)：
Terms in the title
Keywords automatically extracted from the title.
非晶質

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, 
半導体薄膜

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, 
透過スペクトル

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