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J-GLOBAL ID:200902207061953936   Reference number:04A0592868

The Measurement of the Transmission Spectrum of an Amorphous Semiconductor Thin Film

非晶質半導体薄膜の透過スペクトルの測定
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Volume: 2003  Page: 58  Publication year: Jul. 2004 
JST Material Number: L2127A  ISSN: 0911-5730  Document type: Article
Article type: 短報  Country of issue: Japan (JPN)  Language: ENGLISH (EN)
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Other physical chemistry in general  ,  Optical properties of condensed matter in general  ,  Semiconductor thin films 
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