Art
J-GLOBAL ID:200902219844498571   Reference number:08A0833271

Characterization of Ni/i-AlGaN/GaN Schottky Samples Fabricated after H3PO4-Etching

リン酸エッチング後に作製したNi/i-AlGaN/GaNショットキ試料
Author (4):
Material:
Volume: 108  Issue: 121(ED2008 39-108)  Page: 351-355  Publication year: Jul. 02, 2008 
JST Material Number: S0532B  ISSN: 0913-5685  Document type: Proceedings
Article type: 短報  Country of issue: Japan (JPN)  Language: ENGLISH (EN)
Thesaurus term:
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
On J-GLOBAL, this item will be available after more than half a year after the record posted. In addtion, medical articles require to login to MyJ-GLOBAL.

Semi thesaurus term:
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
On J-GLOBAL, this item will be available after more than half a year after the record posted. In addtion, medical articles require to login to MyJ-GLOBAL.

JST classification (1):
JST classification
Category name(code) classified by JST.
Measurement,testing and reliability of solid-state devices 
Terms in the title (6):
Terms in the title
Keywords automatically extracted from the title.

Return to Previous Page