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J-GLOBAL ID:200902228242647460   Reference number:08A0745064

State of the Art X-ray Diffraction Methods for Measuring Stress State in a Single Crystal

単結晶に於ける応力状態を測定する為の最先端のX線回折法
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Volume: 33  Issue:Page: 381-384  Publication year: Jun. 2008 
JST Material Number: L4468A  ISSN: 1382-3469  Document type: Proceedings
Article type: 原著論文  Country of issue: Japan (JPN)  Language: ENGLISH (EN)
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Measuring methods and instruments of force,work load,pressure,friction  ,  Metallic materials 
Reference (8):
  • I. C. Noyan and J. B. Cohen: Residual stress -Measurement by Diffraction and Interpretation-,(Springer-Verlag, New York, 1987) chap. 5.
  • Imura T, Weismann S, Slade JJ Jr. J. Acta Cryst., 15, 786-793(962).
  • Onaga T, Honda K. J. Jpn Soc. Mech. Eng., 73 792-797(1970).(in Japanese)
  • Y. Yoshioka, S. Ohya and Y. Suyama: Proc. 5th Int. Conf. on Residual Stresses, Ed. T. Ericsson, M. Odén and A. Andersson,(Linköping, Sweden, 1997) pp. 528-533.
  • H. Suzuki, K. Akita and H. Misawa: Jpn. J. Appl. Phys., 42, 2876-2880(2003).
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