Art
J-GLOBAL ID:200902242863524232   Reference number:07A0105922

Observations of InGaAs-Quantum Point Contact via Scanning Gate Microscopy

走査ゲート顕微法によるInGaAs量子ポイントコンタクトの観察
Author (2):
Material:
Volume: 42  Issue:Page: 9-18  Publication year: Jan. 15, 2007 
JST Material Number: F0158B  ISSN: 0454-4544  CODEN: KOTBA2  Document type: Article
Article type: 解説  Country of issue: Japan (JPN)  Language: JAPANESE (JA)
Abstract/Point:
Abstract/Point
Japanese summary of the article(about several hundred characters).
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Electrical transport via scann...
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Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
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,...
Semi thesaurus term:
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
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On J-GLOBAL, this item will be available after more than half a year after the record posted. In addtion, medical articles require to login to MyJ-GLOBAL.

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JST classification (1):
JST classification
Category name(code) classified by JST.
Electron and ion microscopes 

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