Art

J-GLOBAL ID：200902243298360847   Reference number：08A0188271

Fluctuations of Field Emission Currents under Extreme High Vacuum

極高真空における電界放出電流のゆらぎ

Author (3)： CHO B. (Precursory Res. for Embryonic Sci. and Technol. (PRESTO), Japan Sci. and Technol. Agency (JST), JPN) ,  ISHIKAWA T. (Kagami Memorial Lab. for Material Sci. and Technol., Waseda Univ., JPN) ,  OSHIMA C. (Kagami Memorial Lab. for Material Sci. and Technol., Waseda Univ., JPN)
Material： e-Journal of Surface Science and Nanotechnology (Web)  (表面科学とナノテクノロジー)
Volume： 6  Page： 64-67 (J-STAGE)  Publication year： 2008 
JST Material Number： U0016A  ISSN： 1348-0391  Document type： Article
Article type： 原著論文  Country of issue： Japan (JPN)  Language： ENGLISH (EN)

Thesaurus term： *extreme high vacuum ,  *field emission ,  *fluctuation ,  *electric current ,  *noise measurement (signal) ,  *field emission electron microscope ,  Tungsten ,  *shot noise ,  *adsorbed gas ,  Carbon Monoxide ,  Hydrogen ,  crystal face ,  electrode tip ,  attenuation characteristic
Semi thesaurus term： shot noise ,  noise measurement ,  *degasification ,  field emission microscope

JST classification (5)： Thermoionic emission and field emission  (BM09020S) ,  Measuring methods and instruments of current,voltage,charge  (AD07020C) ,  Vacuum,highpressure operation  (XD02110O) ,  Vacuum production and techniques  (BA02020L) ,  Rarefied gas dynamics  (BC04000J)

Reference (8)：

• [1] J. C. H. Spence, Experimental High-Resolution Electron Microscopy (Oxford University Press, Oxford, 1988).
• [2] C. Oshima, R. Souda, M. Aono, and Y. Ishizawa, Appl. Phys. Lett 43, 611 (1983).
• [3] S. Yamamoto, S. Fukuhara, N. Saito, and H. Okano, Surf. Sci. 61, 535 (1976).
• [4] S. Yamamoto, S. Fukuhara, and N. Saito, Surf. Sci. 71, 191 (1978).
• [5] W. Swanson, Surf. Sci. 70, 165L (1978).

Terms in the title (3)： 極高真空 ,  電界放出 ,  ゆらぎ