Art
J-GLOBAL ID：200902244236371105   Reference number：04A0785206

A Measure of Quality for n-Detection Test Sets

n-検出テストセットに対する品質の測度
Author (2)：
POMERANZ I

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(Purdue Univ., IN)

About Purdue Univ., IN

, 
REDDY S M

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(Univ. Iowa, IA)

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Material：
IEEE Transactions on Computers  (IEEE Trans Comput)

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Volume： 53  Issue： 11  Page： 1497-1503  Publication year： Nov. 2004 
JST Material Number： C0233A  ISSN： 0018-9340  CODEN： ICTOB4  Document type： Article
Article type： 短報  Country of issue： United States (USA)  Language： ENGLISH (EN)
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*circuit test

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,...
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故障検出率

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JST classification (1)：
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Measurement,testing and reliability of solid-state devices 
(NC03040G)

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テスト

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, 
測度

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