Art

J-GLOBAL ID：200902246537042592   Reference number：05A0709884

Determination of Trace Elements in Sediment Reference Materials by Monochromatic X-ray Excitation X-ray Fluorescence Spectrometry

単色X線励起蛍光X線分析による堆積物参照物質中の痕跡元素の定量

Author (3)： KURAHASHI Masayasu (National Inst. of Advanced Industrial Sci. and Technol. (AIST), Ibaraki, JPN) ,  MIZUTANI Jun (National Inst. of Advanced Industrial Sci. and Technol. (AIST), Ibaraki, JPN) ,  HIOKI Akiharu (National Inst. of Advanced Industrial Sci. and Technol. (AIST), Ibaraki, JPN)
Material： Analytical Sciences  (Anal Sci)
Volume： 21  Issue： 7  Page： 827-832  Publication year： Jul. 10, 2005 
JST Material Number： G0673B  ISSN： 0910-6340  CODEN： ANSCEN  Document type： Article
Article type： 原著論文  Country of issue： Japan (JPN)  Language： ENGLISH (EN)

Thesaurus term： *sediment ,...
Semi thesaurus term： X線蛍光分析

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JST classification (1)： Physical analysis of minerals,rocks,ores  (CC03090Y)

Reference (15)：

• 1. BIPM, IEC, IFCC, ISO, IUPAC, IUPAP, and OIML, “International Vocabulary of Basic and General Terms in Metrology”, 2nd ed., 1993, ISO Geneva, 24.
• 2. Resolutions adapted by the 20th Conference Generale des Poids et Mesures, 1995, 15.
• 3. A. Iida, K. Sakurai, T. Matsusita, and Y. Gohshi, Nucl. Instr. Meth., 1985, 228, 556.
• 4. R. D. Giauque, J. M. Jaklevic, and A. C. Thompson, Anal. Chem., 1986, 58, 940.
• 5. T. Wakisaka, N. Morita, M. Wakasa, S. Terada, K. Nishihagi, and K. Taniguchi, Bunseki Kagaku, 1996, 45, 933.

Terms in the title (6)： 単色X線 ,  励起 ,  蛍光X線分析 ,  堆積物 ,  痕跡元素 ,  定量