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J-GLOBAL ID：200902246557567080   Reference number：06A0012310

Radiation-Induced Soft Errors in Advanced Semiconductor Technologies

最先端半導体技術における放射線起因ソフトエラー
Author (1)：
BAUMANN Robert C.

About BAUMANN Robert C.

(Texas Instruments, TX, USA)

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Material：
IEEE Transactions on Device and Materials Reliability  (IEEE Trans Device Mater Reliab)

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Volume： 5  Issue： 3  Page： 305-316  Publication year： Sep. 2005 
JST Material Number： W1320A  ISSN： 1530-4388  CODEN： ITDMA2  Document type： Article
Article type： 解説  Country of issue： United States (USA)  Language： ENGLISH (EN)
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*VLSI

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Thesaurus term/Semi thesaurus term
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electrical and electric equipment

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JST classification (2)：
JST classification
Category name(code) classified by JST.
Semiconductor integrated circuit 
(NC03162T)

About Semiconductor integrated circuit

,  Measurement,testing and reliability of solid-state devices 
(NC03040G)

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Terms in the title (5)：
Terms in the title
Keywords automatically extracted from the title.
最先端

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, 
半導体技術

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, 
放射線

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, 
起因

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, 
ソフトエラー

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