Relaxation Mechanism of Electrochromism of Tungsten-Oxide Film for Ultra-Multilayer Optical Recording Depending on Sputtering Conditions

SATO Ryuji; KAWAMURA Norikazu; TOKUMARU Haruki

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J-GLOBAL ID：200902252179564581 Reference number：07A0679732

Relaxation Mechanism of Electrochromism of Tungsten-Oxide Film for Ultra-Multilayer Optical Recording Depending on Sputtering Conditions

超多層光学記録用のタングステン酸化物膜のエレクトロクロミズムの緩和機構のスパッタ条件依存性

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Material：
Volume： 46 Issue： 6B Page： 3958-3964 Publication year： Jun. 30, 2007
JST Material Number： G0520B ISSN： 0021-4922 Document type： Article
Article type：原著論文 Country of issue： Japan (JPN) Language： ENGLISH (EN)

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Electronic recording,magnetic recording,optical recording

Reference (8)：

K. Kojima and M. Terao: Tech. Dig. Optical Data Storage Top. Meet., 2003, WC5.
A. Hirotsune, M. Mukoh, and M. Terao: ISOM/ODS Tech. Dig., 2005, MC7.
T. Nishihara, R. Kojima, N. Miyagawa, and N. Yamada: Jpn. J. Appl. Phys.44(2005)3037.
P. M. S. Monk, R. J. Mortimer, and D. R. Rosseinsky: Electrochromism: Fundamentals and Applications (VCH, Weinheim, 1995) p. 65.
J. R. Woodyard and C. B. Cooper: J. Appl. Phys.35(1964)1107.

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