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J-GLOBAL ID：200902252451427696   Reference number：08A0771501

Shape effect of microtwins on high-resolution transmission electron microscope images

高分解能透過型電子顕微鏡像に及ぼすマイクロ双晶の形状の効果
Author (5)：
KURAMOCHI K.

About KURAMOCHI K.

(Tokyo Univ. Sci., Tokyo, JPN)

About Tokyo Univ. Sci., Tokyo, JPN

, 
YAMAZAKI T.

About YAMAZAKI T.

(Tokyo Univ. Sci., Tokyo, JPN)

About Tokyo Univ. Sci., Tokyo, JPN

, 
NAKANISHI N.

About NAKANISHI N.

(Tokyo Univ. Sci., Tokyo, JPN)

About Tokyo Univ. Sci., Tokyo, JPN

, 
HASHIMOTO I.

About HASHIMOTO I.

(Tokyo Univ. Sci., Tokyo, JPN)

About Tokyo Univ. Sci., Tokyo, JPN

, 
WATANABE K.

About WATANABE K.

(Tokyo Metropolitan Coll. Industrial Technol., Tokyo, JPN)

About Tokyo Metropolitan Coll. Industrial Technol., Tokyo, JPN


Material：
Physica Status Solidi. A. Applications and Materials Science  (Physica Status Solidi. A.)

About Physica Status Solidi. A. Applications and Materials Science


Volume： 205  Issue： 7  Page： 1602-1605  Publication year： Jul. 2008 
JST Material Number： D0774A  ISSN： 1862-6300  CODEN： PSSABA  Document type： Article
Article type： 原著論文  Country of issue： Germany, Federal Republic of (DEU)  Language： ENGLISH (EN)
Thesaurus term：
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
On J-GLOBAL, this item will be available after more than half a year after the record posted. In addtion, medical articles require to login to MyJ-GLOBAL.
high resolution electron microscope

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, 
*twin

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, 
shape effect

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, 
Fourier transformation

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, 
image

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, 
Computer Simulation

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, 
superlattice

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, 
nanostructure

About nanostructure

, 
quantum dot

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, 
silicon

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, 
semiconductor

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, 
transmission electron microscope

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, 
electron microscopy

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, 
computer application

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, 
utilization

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Semi thesaurus term：
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
On J-GLOBAL, this item will be available after more than half a year after the record posted. In addtion, medical articles require to login to MyJ-GLOBAL.
superlattice

About superlattice

, 
ミクロ双晶

About ミクロ双晶

, 
Fourier

About Fourier


JST classification (1)：
JST classification
Category name(code) classified by JST.
Lattice defects in semiconductors 
(BK12040Q)

About Lattice defects in semiconductors

Terms in the title (3)：
Terms in the title
Keywords automatically extracted from the title.
高分解能透過型電子顕微鏡

About 高分解能透過型電子顕微鏡

, 
マイクロ

About マイクロ

, 
双晶

About 双晶


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