Crystal growth of polycrystalline silicon thin films for solar cells evaluated by scanning probe microscopy

MUHIDA R; KAWAMURA T; HARANO T; OKAJIMA M; TOYAMA T; OKAMOTO H; HONDA S; TAKAKURA H; HAMAKAWA Y

Art

J-GLOBAL ID：200902257568184613 Reference number：04A0511952

Crystal growth of polycrystalline silicon thin films for solar cells evaluated by scanning probe microscopy

太陽電池用多結晶シリコン薄膜の走査型プローブ顕微鏡によって評価した結晶成長

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Material：
Volume： 338/340 Page： 682-685 Publication year： Jun. 15, 2004
JST Material Number： D0642A ISSN： 0022-3093 Document type： Article
Article type：原著論文 Country of issue： Netherlands (NLD) Language： ENGLISH (EN)

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Crystal growth of semiconductors , Semiconductor thin films , Electrochemistry in general , Solar cell

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