Experimental study and modeling of the influence of screw dislocations on the performance of Au/n-GaN Schottky diodes

HUANG Y; CHEN X D; FUNG S; BELING C D; LING C C

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J-GLOBAL ID：200902266938050416 Reference number：03A0782197

Experimental study and modeling of the influence of screw dislocations on the performance of Au/n-GaN Schottky diodes

Au/n-GaN Schottkyダイオードの性能に対する螺旋転位の影響に関する実験的研究とモデル化

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Material：
Volume： 94 Issue： 9 Page： 5771-5775 Publication year： Nov. 01, 2003
JST Material Number： C0266A ISSN： 0021-8979 CODEN： JAPIAU Document type： Article
Article type：原著論文 Country of issue： United States (USA) Language： ENGLISH (EN)

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Semiconductor-metal contacts , Lattice defects in semiconductors

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