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J-GLOBAL ID:200902267591497306   Reference number:03A0205729

Surface Study by Energy-Filtered RHEED-AES.

エネルギーフィルター型RHEED-AESによる表面研究
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Volume: 24  Issue:Page: 145-152  Publication year: Mar. 10, 2003 
JST Material Number: F0940B  ISSN: 0388-5321  Document type: Article
Article type: 解説  Country of issue: Japan (JPN)  Language: JAPANESE (JA)
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Electron diffraction methods  ,  Surface structure of semiconductors 
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