Art

J-GLOBAL ID：200902269091431050   Reference number：08A0428560

New surface forces apparatus using two-beam interferometry

二ビーム干渉測定を用いた新しい表面力装置

Author (7)： KAWAI Hiroshi (Inst. of Multidisciplinary Res. for Advanced Materials, Tohoku Univ., Katahira, Aoba-ku, Sendai 980-8577, JPN) ,  SAKUMA Hiroshi (Inst. of Multidisciplinary Res. for Advanced Materials, Tohoku Univ., Katahira, Aoba-ku, Sendai 980-8577, JPN) ,  MIZUKAMI Masashi (Inst. of Multidisciplinary Res. for Advanced Materials, Tohoku Univ., Katahira, Aoba-ku, Sendai 980-8577, JPN) ,  ABE Takashi (Inst. of Multidisciplinary Res. for Advanced Materials, Tohoku Univ., Katahira, Aoba-ku, Sendai 980-8577, JPN) ,  FUKAO Yasuhiro (Inst. of Multidisciplinary Res. for Advanced Materials, Tohoku Univ., Katahira, Aoba-ku, Sendai 980-8577, JPN) ,  TAJIMA Haruo (Inst. of Multidisciplinary Res. for Advanced Materials, Tohoku Univ., Katahira, Aoba-ku, Sendai 980-8577, JPN) ,  KURIHARA Kazue (Inst. of Multidisciplinary Res. for Advanced Materials, Tohoku Univ., Katahira, Aoba-ku, Sendai 980-8577, JPN)
Material： Review of Scientific Instruments  (Rev Sci Instrum)
Volume： 79  Issue： 4  Page： 043701  Publication year： Apr. 2008 
JST Material Number： D0517A  ISSN： 0034-6748  CODEN： RSINAK  Document type： Article
Article type： 原著論文  Country of issue： United States (USA)  Language： ENGLISH (EN)

Thesaurus term： *surface force ,  measuring instrument ,  substrate (plate) ,  interaction ,  liquid ,  *Interferometry ,  mirror ,  reflection ,  resolving power ,  distance measurement ,  *mica ,  pure water ,  potassium bromide ,  opacity ,  phase contrast
Semi thesaurus term： *measurement device ,  laser beam ,  mirror

JST classification (2)： Measuring methods and instruments of force,work load,pressure,friction  (AD05050V) ,  Interferometry and interferometers  (BD07070G)

Terms in the title (3)： ビーム ,  干渉測定 ,  表面力