Art

J-GLOBAL ID：200902269195371025   Reference number：06A0058411

Improvement of a Fault Diagnosis Algorithm Using a Signed Digraph with Considering Stuck Faults in Sensors

センサの縮退故障を考慮することによる符号付き有向グラフを用いる故障診断アルゴリズムの改良

Author (3)： TATENO Shigeyuki (Graduate School of Information, Production and Systems, Waseda Univ.) ,  MATSUYAMA Hisayoshi (Graduate School of Information, Production and Systems, Waseda Univ.) ,  TSUGE Yoshifumi (Dep. of Chemical Engineering, Fac. of Engineering, Kyushu Univ.)
Material： Journal of Chemical Engineering of Japan  (J Chem Eng Jpn)
Volume： 39  Issue： 1  Page： 34-42 (J-STAGE)  Publication year： 2006 
JST Material Number： S0629A  ISSN： 0021-9592  CODEN： JCEJAQ  Document type： Article
Article type： 原著論文  Country of issue： Japan (JPN)  Language： ENGLISH (EN)

Thesaurus term： *directed graph ,...

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JST classification (2)： Other system programmings  (JD03070M) ,  Safety management  (KB06000D)

Reference (6)：

• Iri, M., K. Aoki, E. O’shima and H. Matsuyama; “An Algorithm for Diagnosis of System Failures in the Chemical Process,” Comput. Chem. Eng., 3, 489–493 (1979)
• Shiozaki, J., H. Matsuyama, K. Tano and E. O’shima; “Diagnosis of Chemical Process by Use of Signed Digraphs—Extension to 5-Range Patterns of Abnormality,” Kagaku Kogaku Ronbunshu, 10, 233–239 (1984)
• Shiozaki, J., T. Matsuzaki, H. Matsuyama and E. O’shima; “Fault Diagnosis of Chemical Processes by Use of Signed Directed Graphs—Algorithm to Search Multiple Origins of Failures,” Kagaku Kogaku Ronbunshu, 11, 343–346 (1985)
• Vedam, H. and V. Venkatasubramanian; “Signed Digraph Based Multiple Fault Diagnosis,” Comput. Chem. Eng., 21, S655–S660 (1997)
• Washio, T., M. Sakuma and M. Kitamura; “A New Approach to Quantitative and Credible Diagnosis for Multiple Faults of Components and Sensors,” Artif. Intell., 91, 103–130 (1997)

Terms in the title (5)： 縮退故障 ,  符号 ,  有向グラフ ,  故障診断 ,  アルゴリズム