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J-GLOBAL ID:200902272493594933   Reference number:05A0340951

Theoretical Investigation of Dielectric Constant and Elastic Modulus of Two-Dimensional Periodic Porous Silica Films with Elliptical Cylindrical Pores

楕円円筒細孔をもつ二次元周期多孔質シリカ膜の誘電率及び弾性係数の理論的研究
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Volume: 44  Issue:Page: 1161-1165  Publication year: Mar. 15, 2005 
JST Material Number: G0520B  ISSN: 0021-4922  Document type: Article
Article type: 原著論文  Country of issue: Japan (JPN)  Language: ENGLISH (EN)
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Oxide thin films  ,  Dielectrics in general  ,  Mechanical properties of solids in general 
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