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J-GLOBAL ID：200902278507141110   Reference number：09A0647572

Band profiles of ZnMgO/ZnO heterostructures confirmed by Kelvin probe force microscopy

Kelvinプローブ力顕微鏡によって確認したZnMgO/ZnOから成るヘテロ構造のバンドプロフィル

Author (13)： TAMPO H. (National Inst. of Advanced Industrial Sci. and Technol. (AIST), 1-1-1 Umezono, Tsukuba, Ibaraki 305-8568, JPN) ,  SHIBATA H. (National Inst. of Advanced Industrial Sci. and Technol. (AIST), 1-1-1 Umezono, Tsukuba, Ibaraki 305-8568, JPN) ,  MAEJIMA K. (National Inst. of Advanced Industrial Sci. and Technol. (AIST), 1-1-1 Umezono, Tsukuba, Ibaraki 305-8568, JPN) ,  CHIU T.-w. (National Inst. of Advanced Industrial Sci. and Technol. (AIST), 1-1-1 Umezono, Tsukuba, Ibaraki 305-8568, JPN) ,  ITOH H. (National Inst. of Advanced Industrial Sci. and Technol. (AIST), 1-1-1 Umezono, Tsukuba, Ibaraki 305-8568, JPN) ,  YAMADA A. (National Inst. of Advanced Industrial Sci. and Technol. (AIST), 1-1-1 Umezono, Tsukuba, Ibaraki 305-8568, JPN) ,  MATSUBARA K. (National Inst. of Advanced Industrial Sci. and Technol. (AIST), 1-1-1 Umezono, Tsukuba, Ibaraki 305-8568, JPN) ,  FONS P. (National Inst. of Advanced Industrial Sci. and Technol. (AIST), 1-1-1 Umezono, Tsukuba, Ibaraki 305-8568, JPN) ,  CHIBA Y. (Tokyo Univ. of Sci., 2641 Yamazaki, Noda, Chiba 278-8510, JPN) ,  WAKAMATSU T. (Tokyo Univ. of Sci., 2641 Yamazaki, Noda, Chiba 278-8510, JPN) ,  TAKESHITA Y. (Tokyo Univ. of Sci., 2641 Yamazaki, Noda, Chiba 278-8510, JPN) ,  KANIE H. (Tokyo Univ. of Sci., 2641 Yamazaki, Noda, Chiba 278-8510, JPN) ,  NIKI S. (National Inst. of Advanced Industrial Sci. and Technol. (AIST), 1-1-1 Umezono, Tsukuba, Ibaraki 305-8568, JPN)
Material： Applied Physics Letters  (Appl Phys Lett)
Volume： 94  Issue： 24  Page： 242107  Publication year： Jun. 15, 2009 
JST Material Number： H0613A  ISSN： 0003-6951  CODEN： APPLAB  Document type： Article
Article type： 短報  Country of issue： United States (USA)  Language： ENGLISH (EN)

Thesaurus term： force microscope ,  Kelvin method ,  *oxide ,  zinc compound ,  magnesium compound ,  *zinc oxide ,  compound semiconductor ,  *heterojunction ,  band structure ,  Schroedinger equation ,  Poisson equation ,  donor ,  energy level ,  concentration dependence ,  electric charge distribution ,  density
Semi thesaurus term： Kelvin probe force microscope ,  electric charge density

JST classification (1)： Semiconductor-semiconductor contacts without Gr.13-15 element compounds  (BM03083P)

Terms in the title (5)： Kelvinプローブ力顕微鏡 ,  ZnO ,  ヘテロ構造 ,  バンド ,  プロフィル